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| Flexible,
Accurate, and Safe
Data Acquisition and Control
Protection for expensive
test articles from
xxredundant watchdog
controller and Four
xx(4) ms response time
to alarm conditions.
Highly
accurate, distributed control via
xxSix (6) National
Instruments’ PXI chassis,
xxprovides dependable
calibration, derministic
xxperformance, and
repeatable results.
Workflow
automation and test parameters
xxdatabase maximizes
productivity, facilitates
xxtraceability, back
tracking and easy re-runs.
Powerful
and flexible reporting capabilities
xxincluding “Quick
Look,” dynamic graphical
xxoutputs and extensive
automated analysis.
Easily
accommodates a wide variety of test
xxsequences, alarm
conditions, transducer
xxtypes, and data generation
requirements.
Cold-flow/pre-ignition
simulation.
Enterprise-wide
data access.
V I Engineering has developed
a highly accurate, fast response data acquisition
and control system for Jet and Rocket Engine Test
facilities. Designed for world-class propulsion
laboratories, this robust and reliable platform
is capable of managing engine test articles, while
protecting expensive equipment with a four (4) ms
response time to alarm conditions.
Hardware
V I Engineering’s unique design
for distributed, deterministic, real time data acquisition
and control provides a high level of system performance
while minimizing the risk to valuable and expensive
test articles. Six PXI RT controllers are used to
implement data acquisition and control. They are;
Two controllers collect data from the analog
anddigital input channels,
xx and the accelerometers.
A master controller
implements alarm checking and sequence execution
xx for 192 digital
outputs.
A
slave controller performs watchdog monitoring of
the master controller.
An
additional controller streams data to disk and communicates
via
xx TCP/IP to the Host
GUI.
A
redundant controller is available for support.
Data Acquisition &
Control
Deterministic data acquisition for up to
288 channels at 1 - 32 KHz
xxper channel, with
aggregate sampling rate of up to 1.7 MS/s.
Control of up to 192 outputs at 1 KHz.
Time-based or event driven test sequence
control with 1 ms
xxresolution and optional
timeouts.
Data simulation is provided for verifying
test sequences before test article ignition.
xx(cold flow simulation).
Safety &
Alarms
Flexible alarm capability, user defined during
schedule set-up.
Signals compared to limits for user-specified
scans at full sampling rate.
Multiple alarm clauses may be combined to
form compound states.
Coast-down schedule after alarm detection.
Data Analysis
Data logging is configurable within each
test mode.
Post-test Quick Looks provide immediate test
results feedback.
Data files can be exported to TDM format
for in-depth analysis with DIAdem™. .
Software
For the software
architecture, V I Engineering selected LabVIEW™
implemented with Graphical Object Oriented Programming
(GOOP) techniques. The GOOP methodology provides
many specific advantages, including:
Modularity and module independence - the
best possible architecture
xxfor cost-effective
scalability and long term maintainability.
The easiest and most dependable method for
unit, sub-module and
xxsystems testing during
integration and validation.
System Validation
V I Engineering's quality control process
requires both system level (black box) and unit
level (white box) testing for all critical components.
The application is also one of the first LabVIEW
code sets to undergo statement coverage testing.
This was completed using the VISTA™ Statement
Coverage tool which tracks and reports what statements,
and percentage of statements, were exercised during
testing.
COTS Software and Instrumentation
6 - NI PXI-8196 - National
Instruments (NI) PXI Controller
3 -
NI PXI-6512 - Digital Out
4 -
NI PXI-4472 Dynamic Signal Acquisition for Accelerometer
& Pressure Inputs
3 -
NI PXI-6250 M - Multifunction Analog Input
1 -
NI PXI-6511 - Digital Input
1 -
NI SCXI-1520 - Strain Gage Conditioning
12 -
NI SCXI-1125 - Analog Input with Isolation
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Specifications
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|
Control |
|
| Digital Output Capacity |
192 DO available with default and failsafe states,
up to 24 VDC isolated |
| Response |
< 4 ms response to analog data transitions and
process abort buttons |
| Resolution, Jitter |
1 ms |
| Redundancy |
Slave controller failover in < 10 ms to shutdown
secedule execution |
| Data Aquisition |
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| Analog Input Channels |
Net analog input capability of 1.7 MS/s |
| Analog Capacity |
Up to 32 channels at 32 kHz, 24 bit resolution with
full bandwidth anti-aliasing.
Up to 96 channels of voltage or TC sensors sampled at
2 kHz, analog filtered at
4 Hz or 10 kHz
Up to 64 channels of voltage or bridge transducers sampled
at 4 kHz, analog
filtered at 10,100,1000, or 10 kHz
Up to 32 channels at 8 kHz of voltage or bridge transducers
sampled at 8 KHz,
analog filtered at 10,100,1000, or 10 KHz |
| Supported Transducers |
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| Accelerometers |
IEPE, 4 mA integrated excitation capability |
| Pressure Sensors |
350 Ohm bridge transducers, up to 10 V excitation |
| Thermocouples (x Type) |
Types R, J, K, S, T with cold junction compensation |
| Flow, etc |
Conditioned +/-10V signals |
| Calibration |
Can be performed in situ or data manually entered
from cal sheets.
Hardware self-cal implemented to built-in reference
voltages to improve
accuracy between external cals. |
| Digital Input Channels |
|
| Digital Capacity |
64 DI, 2-24 VDC (isolated) |
| Sampling Rate |
1 KHz |
| Timing synchronization |
IRIG-B timestamp |
| Data Logging |
Options include full sampling rate or as multiples
of once every ms
(for example, 1kHz, 500 Hz, 100 Hz, etc.)
Different test modes (Idle, Pre-Test, Test) have separate
logging rates |
| Test Sequences |
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| Events |
Sequences are time or event-based
Events can be defined as a logical combination of up
to 20 clauses
Clauses can be simple (channel > value) or redundant
transducers
(2/3 within tolerance and > limit) |
| Alarms |
Alarms include:
Events (see above)
Digital Inputs (process abort)
Set point timeouts (failure to achieve an event within
a duration)
Valve timeouts (failure to get a digital input indication
within a duration) |
| Run-Time GUI |
Can be customized for facility layout
5 Hz updates for all channels
A subset can be served over intranet
Remote (intranet) calibration capability
Traceable transducer calibration, test configuration,
and test run database
Automatic report generation in DIAdem |
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